Design of Low Power Fault Coverage Circuit Using LT-LFSR
نویسندگان
چکیده
Abstact A new design approach is proposed for a fault coverage circuit. In this design a linear feedback shift register which is called as LT_LFSR (Low Transition Linear Feedback Shift Register) is used. Using LT_LFSR reduces the power consumption by reducing the number of transitions during test mode. Power reduction is done by implementing two new test pattern generation methods in LFSR. In between two consecutive test patterns generated by conventional LFSR, three intermediate random test patterns are injected. These test patterns reduce the power consumption by reducing the switching activity at the primary inputs of Circuit under Test (CUT) without the need of any additional logic. Power consumption results for c17 benchmark circuit with conventional LFSR and with LT-LFSR confirm the reduction in power using LT_LFSR.
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